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Spectrochimica Acta Part B: Atomic Spectroscopy

Articles from the last few issues of Spectrochimica Acta Part B: Atomic Spectroscopy © Elsevier
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  • Preface
    Spectrochimica Acta Part B: Atomic Spectroscopy, Vol. 58, No. 12. (15 December 2003), pp. 2023-2024.
    by ML de Carvalho
  • Quo Vadis total reflection X-ray fluorescence?
    Spectrochimica Acta Part B: Atomic Spectroscopy, Vol. 58, No. 12. (15 December 2003), pp. 2025-2038.
    by S Pahlke
  • A wavelength-dispersive arrangement for wafer analysis with total reflection X-ray fluorescence spectrometry using synchrotron radiation
    Spectrochimica Acta Part B: Atomic Spectroscopy, Vol. 58, No. 12. (15 December 2003), pp. 2039-2048.
    by H Schwenke, PA Beaven, J Knoth, E Jantzen
  • Simultaneous acquisition of X-ray spectra using a multi-wire, position-sensitive gas flow detector
    Spectrochimica Acta Part B: Atomic Spectroscopy, Vol. 58, No. 12. (15 December 2003), pp. 2049-2057.
    by PA Beaven, M Marmotti, R Kampmann, J Knoth, H Schwenke
  • Depth profiles of shallow implanted layers by soft ion sputtering and total-reflection X-ray fluorescence
    Spectrochimica Acta Part B: Atomic Spectroscopy, Vol. 58, No. 12. (15 December 2003), pp. 2059-2067.
    by H Krzyzanowska, A von Bohlen, R Klockenkamper
  • Construction of a windowless Si-anode X-ray tube for a more efficient excitation of low Z elements on Si-wafer surfaces in total reflection fluorescence analysis
    Spectrochimica Acta Part B: Atomic Spectroscopy, Vol. 58, No. 12. (15 December 2003), pp. 2069-2077.
    by T Meinschad, C Streli, P Wobrauschek, C Eisenmenger-Sittner
  • Development of vapor phase decomposition-total-reflection X-ray fluorescence spectrometer
    Spectrochimica Acta Part B: Atomic Spectroscopy, Vol. 58, No. 12. (15 December 2003), pp. 2079-2084.
    by M Yamagami, A Ikeshita, Y Onizuka, S Kojima, T Yamada
  • Total-reflection X-ray fluorescence analysis for semiconductor process characterization
    Spectrochimica Acta Part B: Atomic Spectroscopy, Vol. 58, No. 12. (15 December 2003), pp. 2085-2092.
    by Y Mori, K Uemura
  • Determination of metallic contaminants on Ge wafers using direct- and droplet sandwich etch-total reflection X-ray fluorescence spectrometry
    Spectrochimica Acta Part B: Atomic Spectroscopy, Vol. 58, No. 12. (15 December 2003), pp. 2093-2104.
    by D Hellin, T Bearda, C Zhao, G Raskin, PW Mertens, S De Gendt, MM Heyns, C Vinckier
  • Analysis of low Z elements on Si wafer surfaces with synchrotron radiation induced total reflection X-ray fluorescence at SSRL, Beamline 3-3: comparison of droplets with spin coated wafers
    Spectrochimica Acta Part B: Atomic Spectroscopy, Vol. 58, No. 12. (15 December 2003), pp. 2105-2112.
    by C Streli, G Pepponi, P Wobrauschek, N Zoger, P Pianetta, K Baur, S Pahlke, L Fabry, C Mantler, B Kanngieszer, W Malzer
  • Analysis of low Z elements on Si wafer surfaces with undulator radiation induced total reflection X-ray fluorescence at the PTB beamline at BESSY II
    Spectrochimica Acta Part B: Atomic Spectroscopy, Vol. 58, No. 12. (15 December 2003), pp. 2113-2121.
    by C Streli, G Pepponi, P Wobrauschek, B Beckhoff, G Ulm, S Pahlke, L Fabry, T Ehmann, B Kanngieszer, W Malzer, W Jark
  • Si drift detector in comparison to Si(Li) detector for total reflection X-ray fluorescence analysis applications
    Spectrochimica Acta Part B: Atomic Spectroscopy, Vol. 58, No. 12. (15 December 2003), pp. 2123-2128.
    by F Osmic, P Wobrauschek, C Streli, S Pahlke, L Fabry
  • The use of a portable total reflection X-ray fluorescence spectrometer for field investigation
    Spectrochimica Acta Part B: Atomic Spectroscopy, Vol. 58, No. 12. (15 December 2003), pp. 2129-2138.
    by M Mages, S Woelfl, M Ovari, Tumpling
  • Comparison of synchrotron radiation total reflection X-ray fluorescence excitation-detection geometries for samples with differing matrices
    Spectrochimica Acta Part B: Atomic Spectroscopy, Vol. 58, No. 12. (15 December 2003), pp. 2139-2144.
    by G Pepponi, C Streli, P Wobrauschek, S Zamini, N Zoger, G Falkenberg
  • The use of Si carriers for aerosol particle collection and subsequent elemental analysis by total-reflection X-ray fluorescence spectrometry
    Spectrochimica Acta Part B: Atomic Spectroscopy, Vol. 58, No. 12. (15 December 2003), pp. 2145-2155.
    by F Esaka, K Watanabe, T Onodera, T Taguchi, M Magara, S Usuda
  • Cold plasma ashing improves the trace element detection of single Daphnia specimens by total reflection X-ray fluorescence spectrometry
    Spectrochimica Acta Part B: Atomic Spectroscopy, Vol. 58, No. 12. (15 December 2003), pp. 2157-2168.
    by S Woelfl, M Mages, F Encina
  • Macromolecules by total reflection X-ray fluorescence: marking techniques
    Spectrochimica Acta Part B: Atomic Spectroscopy, Vol. 58, No. 12. (15 December 2003), pp. 2169-2175.
    by S Boeykens, C Vazquez, N Temprano
  • Investigation of lead and nickel contaminated natural biofilms
    Spectrochimica Acta Part B: Atomic Spectroscopy, Vol. 58, No. 12. (15 December 2003), pp. 2177-2181.
    by K Kropfl, G Zaray, E Acs
  • Determination of calcium, potassium, manganese, iron, copper and zinc levels in representative samples of two onion cultivars using total reflection X-ray fluorescence and ultrasound extraction procedure
    Spectrochimica Acta Part B: Atomic Spectroscopy, Vol. 58, No. 12. (15 December 2003), pp. 2183-2189.
    by J Alvarez, LM Marco, J Arroyo, ED Greaves, R Rivas
  • Total reflection X-ray fluorescence and energy-dispersive X-ray fluorescence analysis of runoff water and vegetation from abandoned mining of Pb-Zn ores
    Spectrochimica Acta Part B: Atomic Spectroscopy, Vol. 58, No. 12. (15 December 2003), pp. 2191-2198.
    by AF Marques, I Queralt, ML Carvalho, M Bordalo
  • Analysis of mineral water from Brazil using total reflection X-ray fluorescence by synchrotron radiation
    Spectrochimica Acta Part B: Atomic Spectroscopy, Vol. 58, No. 12. (15 December 2003), pp. 2199-2204.
    by ACM Costa, MJ Anjos, S Moreira, RT Lopes, EFO de Jesus
  • Direct analysis of blood serum by total reflection X-ray fluorescence spectrometry and application of an artificial neural network approach for cancer diagnosis
    Spectrochimica Acta Part B: Atomic Spectroscopy, Vol. 58, No. 12. (15 December 2003), pp. 2205-2213.
    by EA Hernandez-Caraballo, Marco-Parra
  • Biomonitoring of trace elements in muscle and liver tissue of freshwater fish
    Spectrochimica Acta Part B: Atomic Spectroscopy, Vol. 58, No. 12. (15 December 2003), pp. 2215-2226.
    by A Wagner, J Boman
  • Trace elements determination in red and white wines using total-reflection X-ray fluorescence
    Spectrochimica Acta Part B: Atomic Spectroscopy, Vol. 58, No. 12. (15 December 2003), pp. 2227-2232.
    by MJ Anjos, RT Lopes, EFO de Jesus, S Moreira, RC Barroso, CRF Castro
  • Feasibility study of three-dimensional XRF spectrometry using mu-X-ray beams under grazing-exit conditions
    Spectrochimica Acta Part B: Atomic Spectroscopy, Vol. 58, No. 12. (15 December 2003), pp. 2233-2238.
    by K Tsuji, F Delalieux
  • Comparison of conventional and total reflection excitation geometry for fluorescence X-ray absorption spectroscopy on droplet samples
    Spectrochimica Acta Part B: Atomic Spectroscopy, Vol. 58, No. 12. (15 December 2003), pp. 2239-2244.
    by G Falkenberg, G Pepponi, C Streli, P Wobrauschek
  • Analysis of organic contaminants on Si wafers with TXRF-NEXAFS
    Spectrochimica Acta Part B: Atomic Spectroscopy, Vol. 58, No. 12. (15 December 2003), pp. 2245-2253.
    by G Pepponi, B Beckhoff, T Ehmann, G Ulm, C Streli, L Fabry, S Pahlke, P Wobrauschek
  • Application of large-area avalanche photodiodes to X-ray spectrometry of muonic atoms
    Spectrochimica Acta Part B: Atomic Spectroscopy, Vol. 58, No. 12. (15 December 2003), pp. 2255-2260.
    by LMP Fernandes, A Antognini, M Boucher, CAN Conde, O Huot, PE Knowles, F Kottmann, L Ludhova, F Mulhauser, R Pohl, Dos, LA Schaller, D Taqqu, JFCA Veloso
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